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Instruments & Facilities


ILSB Lab
Our diffractometers are often upgraded and new systems are frequently installed, with the support of Agilent Technologies (the former Oxford Diffraction).

This page lists the instruments and facilities currently available for single-crystal diffraction. Operations and safety manuals can be found here.


The Super-Nova is a dual source diffractometer optimised for collecting data from small, weakly-diffracting crystals. It is equipped with molybdenum and copper high-intensity/low -power micro-source X-ray tubes, each of which is equipped with mirror optics to further increase the intensity of the Xray beams at the sample position. Our Super-Nova has a cryojet for low-temperature work to 100K and an Atlas model of CCD detector.

The PX-scanner from Agilent Technologies provides the possibility of checking growing protein crystals in-situ in well-plates, without having to recover and mount the crystals on a conventional diffractometer. You can use it to monitor crystal growth and to select the best crystals for transfer to the diffractometer for full data collection.

Image on the left is copyright of Agilent Technologies.
The Nova diffractometer system from Agilent Technologies is specially designed for protein crystallography. It is equipped with a microsource and special optics to produce a very intense Cu X-ray beam, and has an Onyx CCD detector. It is also equipped with a Cryojet system for routine data collections at 100K.

We use the data to determine the crystal structures of proteins and macromolcules.

This is the Gemini diffractometer system from Agilent Technologies. We use it for the collection of precise X-ray intensity data from single crystals, especially at low temperatures: 100K is routine with a Cryojet system. It is equipped with two Xray sources, Mo and Cu, so that both can be used to obtain precise structures especially of weakly-scattering chiral compounds.

We use the data to determine crystal structures, especially of molecular crystals, for which we can determine the molecular geometry (bond lengths and angles) as well as the packing of the molecules in the crystal.

The is the Xcalibur-2 diffractometer system from Agilent Technologies, equipped with a point detector. We use it mostly for the collection of precise X-ray intensity data from single crystals held at high-pressures in diamond-anvil pressure cells. It can also accommodate CCD detectors.

There are also pictures from the original installation in 2002.
This is the Xcalibur-1 diffractometer system originally supplied by Oxford Diffraction (now Agilent) . Its small physical size and kappa geometry make it ideal for the collection of precise X-ray intensity data from single crystals held at high pressures in diamond-anvil cells.

These data enable us to study the evolution of a crystal structure (i.e. the changes in the bond lengths and angles between the atoms) as we apply pressure to the material.

There are also pictures from the installation.
This single-crystal diffractometer is a customised Eulerian-cradle design from Huber Diffraktionstechnik GmbH, optimised for extremely precise measurements of lattice parameters of crystals held at high-pressures in diamond-anvil cells.

A selection of diamond-anvil cells suitable for single-crystal and powder X-ray diffraction, and capable of generating pressures in excess of 10 GPa is available, together with the extensive preparation facilities necessary for their use.